dice/dwf specification 1 rh1028m/rh1128m information furnished by linear technology corporation is believed to be accurate and reliable. however, no responsibility is assumed for its use. linear technology corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. l , lt, ltc and ltm are registered trademarks of linear technology corporation. all other trademarks are the property of their respective owners. pad function 1. 2. 3. 4. 5. 6. 7. 8. v os trim Cin +in v C over-comp out v + v os trim 114mils 81mils, backside (substrate) metal: alloyed gold layer backside potential: connect to v C 1 3 2 6 7 8 die cross reference ltc finished part number order part number RH1028MW RH1028MW rh1028 dice rh1028 dwf* rh1128mw rh1128mw rh1128 dice rh1128 dwf* please refer to ltc standard product data sheet for other applicable product information. *dwf = dice in wafer form. ultralow noise precision high speed op amps dice/dwf electrical test limits v s = 15v, t a = 25c, v cm = 0v, unless otherwise noted. symbol parameter conditions min max units v os input offset voltage (note 1) 300 v i os input offset current v cm = 0v 150 na i b input bias current v cm = 0v 400 na v in input voltage range 11 v cmrr common mode rejection ratio v cm = 11v v cm = 10.3v 110 db psrr power supply rejection ratio v s = 4v to 16v v s = 4.5v to 16v 110 db a vol large scale voltage gain r l 2k, v o = 10v r l 1k, v o = 10v r l 600, v o = 10v 5 3.5 2 v/v v/v v/v v out maximum output voltage swing r l 2k r l 600 12 10.5 v v 4 5 x = 0 for lt1028b, 1 for lt1128b
dice/dwf specification 2 rh1028m/rh1128m linear technology corporation 1630 mccarthy blvd., milpitas, ca 95035-7417 (408) 432-1900 fax: (408) 434-0507 www.linear.com ? linear technology corporation 2008 lt 0908 ? printed in usa wafer level testing is performed per the indicated speci? cations for dice. considerable differences in performance can often b e observed for dice versus packaged units due to the in? uences of packaging and assembly on certain devices and/or parameters. please consult factory for more information on dice performance and lot quali? cations via lot sampling test procedures. dice data sheet subject to change. please consult factory for current revision in production. i.d.no. 66-13-1028 dice/dwf electrical test limits v s = 15v, t a = 25c, v cm = 0v, unless otherwise noted. note 1: input offset voltage measurements are performed by automatic test equipment approximately 0.5 seconds after application of power. symbol parameter conditions min max units sr slew rate a vcl = C1 (rh1028) a vcl = C1 (rh1128) 11 4.5 v/s v/s i s supply current 10.5 ma
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